Physical access to pins is a luxury of the past. The IEEE 1149.1 standard (JTAG) solves this by placing a shift-register cell between every functional pin and the core logic. These boundary-scan cells can be used to drive signals into the chip or capture outputs, enabling in-circuit testing of soldered boards without physical probes. It is the silent workhorse of every electronics manufacturing line.
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Physical access to pins is a luxury of the past. The IEEE 1149.1 standard (JTAG) solves this by placing a shift-register cell between every functional pin and the core logic. These boundary-scan cells can be used to drive signals into the chip or capture outputs, enabling in-circuit testing of soldered boards without physical probes. It is the silent workhorse of every electronics manufacturing line.
Related search suggestions: (functions.RelatedSearchTerms) digital systems testing and testable design solution
